JPH051623B2 - - Google Patents
Info
- Publication number
- JPH051623B2 JPH051623B2 JP59058817A JP5881784A JPH051623B2 JP H051623 B2 JPH051623 B2 JP H051623B2 JP 59058817 A JP59058817 A JP 59058817A JP 5881784 A JP5881784 A JP 5881784A JP H051623 B2 JPH051623 B2 JP H051623B2
- Authority
- JP
- Japan
- Prior art keywords
- metal silicide
- electrode
- metal
- anode
- schottky diode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76886—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances
- H01L21/76889—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances by forming silicides of refractory metals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/28537—Deposition of Schottky electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/64—Electrodes comprising a Schottky barrier to a semiconductor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/60—Schottky-barrier diodes
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59058817A JPS60201666A (ja) | 1984-03-27 | 1984-03-27 | 半導体装置 |
US07/228,848 US4862244A (en) | 1984-03-27 | 1988-08-03 | Semiconductor device having Schottky barrier between metal silicide and silicon |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59058817A JPS60201666A (ja) | 1984-03-27 | 1984-03-27 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60201666A JPS60201666A (ja) | 1985-10-12 |
JPH051623B2 true JPH051623B2 (en]) | 1993-01-08 |
Family
ID=13095165
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59058817A Granted JPS60201666A (ja) | 1984-03-27 | 1984-03-27 | 半導体装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US4862244A (en]) |
JP (1) | JPS60201666A (en]) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5079182A (en) * | 1990-04-02 | 1992-01-07 | National Semiconductor Corporation | Bicmos device having self-aligned well tap and method of fabrication |
JP3023853B2 (ja) * | 1990-08-23 | 2000-03-21 | 富士通株式会社 | 半導体装置の製造方法 |
US5075740A (en) * | 1991-01-28 | 1991-12-24 | Sanken Electric Co., Ltd. | High speed, high voltage schottky semiconductor device |
US5583348A (en) * | 1991-12-03 | 1996-12-10 | Motorola, Inc. | Method for making a schottky diode that is compatible with high performance transistor structures |
US5418185A (en) * | 1993-01-21 | 1995-05-23 | Texas Instruments Incorporated | Method of making schottky diode with guard ring |
US5460983A (en) * | 1993-07-30 | 1995-10-24 | Sgs-Thomson Microelectronics, Inc. | Method for forming isolated intra-polycrystalline silicon structures |
JP2755185B2 (ja) * | 1994-11-07 | 1998-05-20 | 日本電気株式会社 | Soi基板 |
US6121122A (en) | 1999-05-17 | 2000-09-19 | International Business Machines Corporation | Method of contacting a silicide-based schottky diode |
US6998694B2 (en) * | 2003-08-05 | 2006-02-14 | Shye-Lin Wu | High switching speed two mask Schottky diode with high field breakdown |
US7812441B2 (en) | 2004-10-21 | 2010-10-12 | Siliconix Technology C.V. | Schottky diode with improved surge capability |
TWI278090B (en) * | 2004-10-21 | 2007-04-01 | Int Rectifier Corp | Solderable top metal for SiC device |
US9419092B2 (en) * | 2005-03-04 | 2016-08-16 | Vishay-Siliconix | Termination for SiC trench devices |
US7834376B2 (en) | 2005-03-04 | 2010-11-16 | Siliconix Technology C. V. | Power semiconductor switch |
JP2006310555A (ja) * | 2005-04-28 | 2006-11-09 | Nec Electronics Corp | 半導体装置およびその製造方法 |
US8368165B2 (en) | 2005-10-20 | 2013-02-05 | Siliconix Technology C. V. | Silicon carbide Schottky diode |
US8435873B2 (en) | 2006-06-08 | 2013-05-07 | Texas Instruments Incorporated | Unguarded Schottky barrier diodes with dielectric underetch at silicide interface |
KR100763848B1 (ko) * | 2006-07-05 | 2007-10-05 | 삼성전자주식회사 | 쇼트키 다이오드 및 그 제조 방법 |
US9627552B2 (en) * | 2006-07-31 | 2017-04-18 | Vishay-Siliconix | Molybdenum barrier metal for SiC Schottky diode and process of manufacture |
US8338906B2 (en) * | 2008-01-30 | 2012-12-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Schottky device |
US8193602B2 (en) * | 2010-04-20 | 2012-06-05 | Texas Instruments Incorporated | Schottky diode with control gate for optimization of the on state resistance, the reverse leakage, and the reverse breakdown |
CN102280465B (zh) * | 2010-06-13 | 2013-05-29 | 北京大学 | 阻变随机访问存储器件及制造方法 |
US8729599B2 (en) | 2011-08-22 | 2014-05-20 | United Microelectronics Corp. | Semiconductor device |
JP6095284B2 (ja) * | 2012-06-27 | 2017-03-15 | キヤノン株式会社 | ショットキーバリアダイオード及びそれを用いた装置 |
RU2550374C1 (ru) * | 2014-02-21 | 2015-05-10 | Открытое акционерное общество "Оптрон" | Кремниевый диод с барьером шоттки и способ его изготовления |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3550260A (en) * | 1968-12-26 | 1970-12-29 | Motorola Inc | Method for making a hot carrier pn-diode |
US3907617A (en) * | 1971-10-22 | 1975-09-23 | Motorola Inc | Manufacture of a high voltage Schottky barrier device |
JPS56144577A (en) * | 1980-04-10 | 1981-11-10 | Fujitsu Ltd | Production of semiconductor device |
JPS5821382A (ja) * | 1981-07-29 | 1983-02-08 | Toshiba Corp | シヨツトキ−・バリヤ・ダイオ−ドの製造方法 |
US4441931A (en) * | 1981-10-28 | 1984-04-10 | Bell Telephone Laboratories, Incorporated | Method of making self-aligned guard regions for semiconductor device elements |
US4518981A (en) * | 1981-11-12 | 1985-05-21 | Advanced Micro Devices, Inc. | Merged platinum silicide fuse and Schottky diode and method of manufacture thereof |
-
1984
- 1984-03-27 JP JP59058817A patent/JPS60201666A/ja active Granted
-
1988
- 1988-08-03 US US07/228,848 patent/US4862244A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS60201666A (ja) | 1985-10-12 |
US4862244A (en) | 1989-08-29 |
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